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Highly Accelerated Stress Test Chamber(HAST Chamber)

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Highly Accelerated Stress Test Chamber(HAST Chamber)

Highly Accelerated Stress Test Chamber(HAST Chamber)

Description

The High Accelerated Stress Test Chamber (HAST) is designed for the semiconductor chip industry, as well as for applications in civil aviation, commercial aerospace, shipping, automotive, new energy, scientific research institutions, and universities. It is used to test electronic parts, components, integrated circuits, materials, and processes by accelerating high-temperature, high-humidity, high-pressure cycling and constant stress tests, in order to determine whether functional failures occur due to durability (service life) or environmental changes.

Prooduct Name Highly Accelerated Stress Test Chamber(HAST Chamber)
Prooduct Model HPSC251-M HPSC252-M
Working chamber volume 51L 51L×2 tanks
Working chamber dimensions φ380×D450(R×D) φ380×D450(R×D)×2 tanks
Tank Size φ450×D600(R×D) φ450×D600(R×D)×2 tanks
External dimensions 1200×1960×1140mm（W×H×D） 1200×2170×1140mm（W×H×D）
Temperature range 105℃～150℃
Temperature fluctuation ≤±0.5℃
Temperature uniformity ≤2℃
Temperature deviation ±2℃
Pressure Range 110kPa～300kPa(Absolute Pressure)

Mainly engaged in environmental test equipment, instrumentation and accessories design, manufacturing, sales, technical advice and maintenance services.

Information